Particle Characterization with Dynamic Image Analysis

Sieve analysis and laser diffraction are long established methods for the determination of particle size distributions. Dynamic Image Analysis (DIA) is another particle analysis technology to measure particles > 1 micron which has numerous advantages over these methods.

Retsch Technology’s particle analyzers CAMSIZER and CAMSIZER XT, which are based on DIA technology, evaluate images of the particles which provide considerably more information on the particles than, for example, a light scattering pattern produced by a laser diffraction particle analyzer. These only allow for an indirect measurement of the particle size. The determination of parameters such as the length, width, or sphericity of particles is only possible by using image analysis.

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